Loren Data's SAM Daily™

fbodaily.com
Home Today's SAM Search Archives Numbered Notes CBD Archives Subscribe
SAMDAILY.US - ISSUE OF JULY 02, 2025 SAM #8619
SPECIAL NOTICE

70 -- TECHNOLOGY LICENSING OPPORTUNITY: Intelligent, Rapid and Optimized Dimensional Inspection (IRODI)

Notice Date
6/30/2025 11:45:33 AM
 
Notice Type
Special Notice
 
NAICS
541511 — Custom Computer Programming Services
 
Contracting Office
TRIAD - DOE CONTRACTOR Columbus OH 43201 USA
 
ZIP Code
43201
 
Solicitation Number
S-191488
 
Response Due
6/15/2025 10:00:00 PM
 
Archive Date
10/01/2025
 
Point of Contact
Mike Erickson, Lindsay Augustyn
 
E-Mail Address
licensing@lanl.gov, licensing@lanl.gov
(licensing@lanl.gov, licensing@lanl.gov)
 
Description
IRODI�s Maestro software integrates with your existing metrology tools to perform surface dimensional inspections of machined components. https://www.lanl.gov/engage/collaboration/feynman-center/tech-and-capability-search/irodi The Challenge: Manufacturers rely on precise dimensional inspections to meet engineering specifications; however, traditional methods are slow, create bottlenecks, and often rely on offsite measurements. The IRODI system is being developed to address these challenges by enabling real-time, in-process inspections on the production floor through the integration of optical scanning and the accuracy of coordinate measuring machines (CMMs). How it Works: A key component of IRODI, the Maestro software, has been tested in a lab setting using CMMs and laser scanners to perform dimensional inspections of machined components. Maestro integrates with existing metrology tools to coordinate inspections, analyze measurement data, and optimize quality control. A key attribute for MAESTRO is significantly reduced time for small batch inspection. The full IRODI system is designed to automate inspection planning, enable on-machine inspection across both subtractive and additive processes, identify defects earlier, reduce rework, support real-time decision-making, and integrate seamlessly with current manufacturing environments. Key Advantages: Improve inspection coverage and accuracy Adaptive algorithms identify critical measurement points Enables dimensional validation both during manufacturing and the design phase Problems Solved: Identifies defects early to reduce waste Matches parts for optimal fit based on tolerance Aligns hardware and quality control processes Market Applications: Advanced Manufacturing Aerospace and Defense Automotive Medical Devices Nuclear and Energy Semiconductors Development Status: TRL 5 US Provisional Patent Application No., Docket No.: Patent pending, S-191488: Method and System for Efficient Inspection of Manufacturing Triad National Security, LLC / Los Alamos National Laboratory is seeking a partner to commercialize the IRODI system through a technical collaboration under a CRADA or a license agreement to develop a commercial prototype and leverage LANL�s intellectual property. LANL Tech Partnerships: Unlock the Innovative Potential Los Alamos National Laboratory offers a wide range of cutting-edge technologies and capabilities that may provide your company with a competitive edge in the market and unlock the innovative potential that can enhance, refine, and revolutionize your products. LANL�s licensing program focuses on moving inventions developed by our researchers to commercial innovations. Patented and patent pending inventions and copyrighted software are available to existing and start-up companies through exclusive and non-exclusive licensing agreements. For specific discussions, please contact licensing@lanl.gov. Note: This is not a call for external services for the development of this technology. https://www.lanl.gov/engage/collaboration/feynman-center/partner-with-us/licensing-technology https://www.lanl.gov/engage/collaboration/feynman-center/tech-and-capability-search LA-UR-25-23024
 
Web Link
SAM.gov Permalink
(https://sam.gov/opp/7d8f6b96810445fcbf1d8a474be3ddac/view)
 
Place of Performance
Address: Los Alamos, NM 87545, USA
Zip Code: 87545
Country: USA
 
Record
SN07493251-F 20250702/250630230042 (samdaily.us)
 
Source
SAM.gov Link to This Notice
(may not be valid after Archive Date)

FSG Index  |  This Issue's Index  |  Today's SAM Daily Index Page |
ECGrid: EDI VAN Interconnect ECGridOS: EDI Web Services Interconnect API Government Data Publications CBDDisk Subscribers
 Privacy Policy  Jenny in Wanderland!  © 1994-2024, Loren Data Corp.